The Reltron flashFMI Thermal Hot Spot Detection system provides the fastest, most economical, high spatial resolution thermal detection system for integrated circuits.

By precisely timing the high-bit depth camera frames relative to modulation of the DUT bias and UV illumination, we can measure the thermal profile of the component at any time interval (>1mS) after the application of power, or the application of a clock, or any desired user event.

  • Short localization
  • Temperature profiling
  • Heat Diffusion/Spreading
  • Hot Spots
  • Power Dissipation Studies

The Reltron Advantage

  • Low resolution, high cost, IR camera not needed
  • Ease of use
  • Excellent spatial resolution
  • Heat vs. Time capability
  • Can use same EMMI CCD camera
  • 360nm UV light source can be used for UV Imaging
  • Very Economical
  • Through-the-lens UV application
  • Can use high magnification objectives
  • flashFMI Thermal can be added to any existing EMMI system! Call us today for a demo.

Standard Features

  • 1.4Mpixel maximum image resolution
  • Intuitive flashFMI Software GUI
  • MULTIWAVE 6-wavelength SW-controlled Illuminator
  • Single channel Keithley power supply and SW IV curve tracer

Optional Features

  • 4-channel Keithley DUT power supply and software IV curve tracer
  • Custom Dark Box
  • Anti-Vibration Table
  • Probe Station
  • DUT Temperature Controller:  Fast Heating and Cooling Control Chuck
  • High Voltage (up to 5KV) DUT Power Supply and software IV curve tracer


Our CAD navigation feature allows efficient identification of circuit net associated with photon emission or hot spot

2994 Scott Boulevard | Santa Clara, CA 95054 | Voice:(408)235-8690 | eFAX:(888)625-4418 | email: info@reltron.com
© 2009 Reltron LLC. All rights reserved.